Northrop Grumman has demonstrated a secure testing environment for radiation-exposed microelectronics under DARPA’s ASSERT program, the company announced on January 13, 2026. According to Northrop Grumman, the achievement is part of DARPA’s Advanced Sources for Single-event Effects Radiation Testing (ASSERT) effort, which aims to create compact laboratory alternatives to heavy-ion test facilities. The company said […]
Source link
NG tests new radiation-hardening microelectronics system
Date:
More like thisRelated
U.S. Army converts 56th Stryker brigade to Mobile brigade
The United States Army is converting the Pennsylvania...
How Singapore Airlines creates in-flight comfort food
Chef Damien Le Bihan, Singapore Airlines’ Food &...
China fields Type 96A tanks equipped with APS
Chinese armored units have been observed operating Type...
