Northrop Grumman has demonstrated a secure testing environment for radiation-exposed microelectronics under DARPA’s ASSERT program, the company announced on January 13, 2026. According to Northrop Grumman, the achievement is part of DARPA’s Advanced Sources for Single-event Effects Radiation Testing (ASSERT) effort, which aims to create compact laboratory alternatives to heavy-ion test facilities. The company said […]
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NG tests new radiation-hardening microelectronics system
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